Display apparatus including a shielding conductive layer

ABSTRACT

A display apparatus including a shielding conductive layer is disclosed. The display apparatus includes a substrate, a driving thin film transistor disposed on the substrate, wherein the driving thin film transistor includes a driving semiconductor layer and a driving gate electrode, a scan line overlapping the substrate and extending in a first direction, a data line extending in a second direction crossing the first direction, wherein the data line is insulated from the scan line by an insulating layer , a node connection line disposed on a same layer as the scan line, and a shielding conductive layer disposed between the data line and the node connection line, in which a first end of the node connection line is connected to the driving gate electrode via a first node contact hole.

CROSS-REFERENCE TO RELATED APPLICATION

This application claims priority under 35 U.S.C. § 119 to Korean PatentApplication No, 10-2018-0161174, filed on Dec. 13, 2018, in the KoreanIntellectual Property Office, the disclosure of which is incorporated byreference herein in its entirety.

TECHNICAL FIELD

The present invention relates to a display apparatus, and moreparticularly,.to a display apparatus including a shielding conductivelayer.

DESCRIPTION OF THE RELATED ART

Display apparatuses are apparatuses for displaying an image and may Incode liquid crystal displays, electrophoretic displays organiclight-emitting displays, inorganic light-emitting (EL) displays, fieldemission displays, surface-conduction electron-emitter displays, plasmadisplays, or cathode ray displays.

Display apparatuses that display an image in response to received datamay include a substrate. A substrate included in a display apparatus maybe sectioned into a display area and a peripheral area. The display areamay be provided with a scan line and a data line that are insulated fromeach other,and a plurality of pixels connected thereto. The display areamay include a thin film transistor corresponding to each of the pixelsand a pixel electrode electrically connected to the thin filmtransistor. Furthermore, the display area may be provided with a counterelectrode that is commonly connected with the plurality of pixels Theperipheral area may be provided with various wirings for transmittingelectric signals to the display area, a scan driver, a data driver,and/or a controller.

Display apparatus versatility of use increases as the thicken and weightof the display apparatus decrease. For high quality and high resolutionof a display apparatus, the design of a pixel circuit included in apixel is diversified.

SUMMARY

An exemplary embodiment of the present invention discloses a displayapparatus including a shielding conductive layer for implementing a highquality image.

An exemplary embodiment of the present invention discloses a displayapparatus comprising a substrate. A driving thin film transistor isdisposed on the substrate, wherein the driving thin film transistorincludes a driving semiconductor layer and a driving gate electrode. Ascan line overlaps the substrate and extends in a first direction. Adata line extends in a second direction crossing the first direction,wherein the data line is insulated from the scan line by an insulatinglayer disposed therebetween. A node connection line is disposed on asame layer as the scan line. A shielding conductive layer is disposedbetween the data line and the nod a connection line. A first end of thenode connection line is connected to the driving gate electrode via afirst node contact hole.

An exemplary embodiment of the present invention discloses a storagecapacitor overlapping the driving thin film transistor and having alower electrode and an upper electrode, wherein the shielding conductivelayer extends from a side of the upper electrode,

An exemplary embodiment of the present invention discloses the lowerelectrode of the storage capacitor is connected to the driving gateelectrode of the driving thin film transistor.

An exemplary embodiment of the present invention discloses a drivingvoltage line extending in the second direction and disposed on a samelayer as the data line, wherein the shielding conductive layer isconnected to the driving voltage line.

An exemplary embodiment of the present invention discloses acompensation thin film transistor connected to the scan line andincluding a compensation semiconductor layer and a compensation gateelectrode. A semiconductor connection line extends from the compensationsemiconductor layer. A second end of the node connection line isconnected to the semiconductor connection line via a second node contacthole.

An exemplary embodiment of the present invention discloses each of theshielding conductive layer and the semiconductor connection lineincludes a portion extending in the second direction.

An exemplary embodiment of the present invention discloses a resistancevalue of the scan line is less than a resistance value of the drivinggate electrode.

An exemplary embodiment of the present invention discloses a storagecapacitor in which the driving gate electrode, functions as a lowerelectrode of the storage capacitor. An upper electrode is overlaps thelower electrode and has a storage opening The first node contact hole isdisposed in the storage opening.

An exemplary embodiment of the present invention discloses a size of thestorage opening is greater than a size of the first node contact hole.

An exemplary embodiment of the present invention discloses an emissioncontrol thin film transistor is disposed on the substrate and includesan emission control semiconductor layer and an emission control gateelectrode. An emission control signal is transmitted to the emissioncontrol gate electrode through the emission control lines, wherein theemission control gate electrode is provided as a part of the emissioncontrol lines.

An exemplary embodiment of the present invention discloses a displayapparatus comprising a substrate. A driving thin film transistor isdisposed on the substrate and has a driving gate electrode and a drivingsemiconductor layer. A first gate insulating layer is disposed betweenthe driving gate electrode and the driving semiconductor layer. A secondgate insulating layer covers the driving gate electrode. A shieldingconductive layer is disposed on the second gate insulating layer. Aninterlayer insulating layer covers the shielding conductive layer. Anode connection line is disposed on the interlayer insulating layer andis connected to the driving gate electrode via a first node contact holepenetrating the interlayer insulating layer and the second gateinsulating layer. A scan line is disposed on a same layer as the nodeconnection line and extends in a first direction. A via layer covers thescan line and the node connection line. A data line is disposed on thevia layer and extends in a second direction crossing the firstdirection. The shielding conductive layer extends in the seconddirection between the data line and the node connection line.

An exemplary embodiment of the present invention discloses that aresistance value of the scan line is less than a resistance value of thedriving gate electrode.

An exemplary embodiment of the present invention discloses a storagecapacitor overlapping the driving thin film transistor and having alower electrode and an upper electrode, wherein the shielding conductivelayer extends from the upper electrode in the second direction.

An exemplary embodiment of the present invention discloses the lowerelectrode of the storage capacitor is integrally formed with the drivinggate electrode of the driving thin film transistor.

An exemplary embodiment of the present invention discloses the upperelectrode has a storage opening, the storage opening has a closed curveshape, and the first node contact hole is disposed in the storageopening.

An exemplary embodiment of the present invention discloses the drivingsemiconductor layer is bent.

An exemplary embodiment of the present invention discloses a drivingvoltage line extending in the second direction and disposed on a samelayer as the data line, wherein the shielding conductive layer receivesa direct current (DC) voltage through the driving voltage line.

An exemplary embodiment of the present invention discloses acompensation thin film transistor connected to the scan line andincluding a compensation semiconductor layer and a compensation gateelectrode. A semiconductor connection line extends from the compensationsemiconductor layer, wherein an end of the node connection line isconnected to the semiconductor connection line via a second node contacthole.

An exemplary embodiment of the present invention discloses a shieldingconductive layer and the semiconductor connection line include a portionextending in the second direction.

An exemplary embodiment of the present invention discloses an emissioncontrol thin film transistor disposed on the substrate and including anemission control semiconductor layer and an emission control gateelectrode. An organic light-emitting diode is connected to the emissioncontrol thin film transistor.

An exemplary embodiment of the present invention discloses that theportion of the shielding conductive layer extending in the seconddirection is longer than the portion of the semiconductor connectionline extending in the second direction.

An exemplary embodiment of the present invention discloses that the nodeconnection line includes a portion extending in the second direction andthe portion of the shielding conductive layer extending in the seconddirection longer than the portion of the node connection line extendingthe second direction.

An exemplary embodiment of the present invention discloses that theshielding conductive layer is disposed between a via of the data lineand the second node contact hole and at least partially surrounds both.

BRIEF DESCRIPTION OF THE DRAWINGS

The above and other features of the present invention will be moreclearly understood from the following detailed description taken inconjunction with the accompanying drawings, in which:

FIG. 1 schematically illustrates a display apparatus according to anexemplary embodiment of the present invention;

FIG. 2 is a block diagram schematically illustrating a display apparatusaccording to an exemplary embodiment of the present invention;

FIG. 3 is an equivalent circuit diagram of a pixel included in thedisplay apparatus of FIG. 1;

FIG. 4 is a layout diagram schematically illustrating the positions of aplurality of thin film transistors and capacitors included in a pixelcircuit, according to an exemplary embodiment of the present invention;

FIG. 5 is an enlarged layout diagram of a shielding conductive layer andparticular elements in the vicinity of the shielding conductive layerdepicted in FIG. 4;

FIG. 6 is a cross-sectional view taken along line I-I′ of FIG. 4; and

FIG. 7 is a cross-sectional view taken along lines II-II′ and III-III′of FIG. 4 illustrating an organic light-emitting diode,

DETAILED DESCRIPTION OF THE EMBODIMENTS

Exemplary embodiments of the present invention will now be described orefully with reference to the accompanying drawings. However, theinvention may be embodied in many alternate forms and should not beconstrued as limited to only the exemplary embodiments of the presentdisclosure set forth herein. It be understood that like referencenumerals may refer to like elements throughout the detailed descriptionand accompanying figures.

In the following embodiments, the singular forms “a,” “an” and “the” areintended to include the plural forms as well, unless the context clearlyindicates otherwise.

In the following embodiments, it will be further understood that theterms “comprises” and/or “comprising” used herein specify the presenceof stated features or components, but do, not preclude the presence oraddition of one or more other features or components.

In the following embodiments, it will be understood that when a layerarea, or component is referred to as being “formed on” another layer,area, or component, it can be directly or indirectly formed on the otherlayer, area, or component. In other words, intervening layers, areas, orcomponents may be present.

In the figures, sizes of components may be exaggerated for convenienceof explanation. In other words, since sizes and thicknesses ofcomponents in the drawings are arbitrarily illustrated for convenienceof explanation, the following embodiments are not limited thereto.

In the following embodiments, it will be understood that when a layer,area, or component is referred to as being “connected to” another layer,area, or component, it can be directly connected to the other layer,area, or component or indirectly connected to the other layer, area, orcomponent via intervening layers, areas, or components. For example, inthe present specification, when a layer, area, or component is referredto as being electrically connected to another layer, area, or component,it can be directly electrically connected to the other layer, area, orcomponent, or indirectly electrically connected to the other layer,area, or component via intervening layers, areas, or components.

In the following description, an organic light-emitting displayapparatus is described as a display apparatus according to an exemplaryembodiment of the present invention, but the present, invention is notlimited thereto and various types of display apparatuses may be used.

FIG. 1 schematically illustrates a display apparatus according to anexemplary embodiment of the present invention.

Referring to FIG. 1, a display apparatus may include a display area DAand a peripheral area PA that is a non-display area. Pixels PX includingan organic light-emitting diode may be arranged in the display area DAto provide a certain image. The peripheral area PA may be an area thatdoes not display an image. The peripheral area PA may include a scandriver and a data driver for providing electric signals to the pixels PXof the display area DA and power lines for supplying power such as adriving voltage and a common voltage.

FIG. 2 is a block diagram schematically illustrating a display apparatusaccording to an exemplary embodiment of the present invention.

An organic light-emitting display apparatus according to an exemplaryembodiment of the present invention may include a display portion 10including a plurality of pixels PX, a scan driver 20, a data driver 30,an emission control driver 40, and a controller 50.

The display portion 10 is disposed in the display area DA, and mayinclude the pixels PX located at intersections of a plurality of scanlines SL1 to SLn+1, a plurality of data lines DL1 to DLm, and aplurality of emission control lines EL1 to ELn, and arranged in amatrix. The scan lines SL1 to SLn+1 and the emission control lines EL1to ELn may extend in a first direction that is a row direction, and thedata lines DL1 to DLm and a driving voltage line ELVDDL may extend in asecond direction that is a column direction. In one pixel line, a numberof the scan lines SL1 to SLn+1 may be different from a number of theemission control lines EL1 to ELn. In other words, the number of scanlines SL1 to SLn+1 may be greater than the number of emission controllines EL1 to ELn.

Each of the pixels PX may be connected to three of the scan lines SL1 toSLn+1, the data driver 30, and the driving voltage line ELVDDL The scandriver 20 generates and transmits three scan signals to each of thepixels PX via scan lines SL1 to SLn+1. In other words, the scan driver20 sequentially supplies scan signals via each of scan lines SL2-SLn,each of previous scan lines SL1-SLn−1,or each of subsequent scan linesSL3-SLn+1.

An initialization voltage line IL may receive an initialization voltagefrom an external power supply source VINT and supply the voltage to eachof the pixels PX.

Furthermore, each of the pixels PX may be connected to one of the datalines DL1 to DLm, and one of the emission control lines EL1 to ELn.

The data driver 30 transmits a data signal to each of the pixels PX viadata lines DL1 to DLm. Whenever a scan signal is supplied to each of thescan lines SL2-SLn, the data signal is supplied to one of the pixels PXthat is selected by the scan signal.

The emission control driver 40 generates and transmits an emissioncontrol signal to each of the pixels PX via emission control lines EL1to ELn. The emission control signal controls an emission period of thepixels PX. In other words, the emission control driver 40 transmittingthe emission control signal to the emission control lines EL1 to ELn maydetermine a length of time during which the pixels PX transmit light anddisplay an image. The emission control driver 40 may be omitteddepending on the internal structure of the pixels PX.

The controller 50 may be configured to convey signals to each of thescan driver 20, the data driver 30, and the emission control driver 40.For example, the controller 50 may convert a plurality of image signalsIR IG. and IB received from the outside to a plurality of image datasignals DR, DG, and DB and transmit the converted signals to the datadriver 30. Additionally, the controller 50 may receive a vertical syncsignal Vsync, a horizontal sync signal Hsync, and a clock signal MCLK,generates a control signal to control driving of the scan driver 20, thedata driver 30, and the emission control driver 40, and transmits thegenerated signal thereto. In other words, the controller 50 generates ascan driving control signal SCS for controlling the scan driver 20, adata driving control signal DCS for controlling the data driver 30, andan emission driving control signal ECS for controlling the emissioncontrol driver 40 and transmits the generated signals thereto.

Each of the pixels PX receives a driving power voltage ELVDD from theoutside and a common power voltage ELVSS. The driving power voltageELVDD may be a high level voltage, and the common power voltage ELVSSmay be a ground voltage or a voltage lower than the driving powervoltage ELVDD. The driving power voltage ELVDD may be supplied to eachof the pixels PX via the driving voltage line ELVDDL.

Each of the pixels PX may emit light of a certain brightness by a drivecurrent supplied to a light-emitting device according to a data signaltransmitted via data lines DL1 to DLm.

FIG. 3 is an equivalent circuit diagram of a pixel included in thedisplay apparatus of FIG. 1.

Referring to FIG. 3, the pixel PX may include signal lines 121, 131,132, 133, and 151, a plurality of thin film transistors (TFTs) T1, T2,T3, T4, T5, T6, and T7 connected to the signal lines 121, 131 132, 133,and 151, a capacitor Cst, an initialization voltage line 123, a drivingvoltage line 152, and the organic light emitting diode OLED.

Although FIG. 3 illustrates a case in which the signal lines 121, 131,132, 133 and 151, the initialization voltage line 123, and the drivingvoltage line 152 are provided for every one of the pixels PX, thepresent invention is not limited thereto. In another embodiment of thepresent invention, at least one of the signal lines 121, 131, 132, 133,151 and the initialization voltage line 123 may be shared by neighboringpixels.

The TFTs may include TFT S T1-T7. For example, TFTS T1-T7 may include adriving TFT T1, a switching TFT T2, a compensation TFT T3, a firstinitialization TFT T4, an operation control TFT T5, an emission controlTFT T6, and a second initialization TFT T7.

The signal lines may include the scan line 131 for transmitting a scansignal S the previous scan line 132 for transmitting a previous scansignal Sn−1 to the first initialization TFT T4, the subsequent scan line133 fore transmitting a subsequent scan signal Sn+1 to the secondinitialization TFT T7. Each of the scan lines 131-133 may be connectedto the scan driver 20. The emission control line 121 may be connected tothe emission control driver 40 and may be provided for transmitting anemission control signal En to the operation control TFT T5 and theemission control TFT T6. A data line 151 may be provided that isconnected to the data driver 30 and may intersect the orthogonallydisposed scan line 131 and transmit a data signal Dm to the pixel PX.The driving voltage line 152 may transmit the driving power voltageELVDD to the driving TFT T1, and the initialization voltage line 123 maytransmit an initialization voltage Vint for initializing the driving TFTT1 and a pixel electrode.

A driving gate electrode G1 of the driving TFT T1 may be connected to alower electrode Cst1 of a storage capacitor Cst. A driving sourceelectrode S1 of the driving TFT T1 is connected to the driving voltageline 152 via the operation control TFT T5. A driving drain electrode D1of the driving TFT T1 may be electrically connected to the pixelelectrode of the organic light emitting diode OLED via the emissioncontrol TFT T6. The driving TFT T1 may receive the data signal Dm basedon a switching operation of the switching TFT T2 and supplies a drivingcurrent l_(OLED) to the organic light emitting diode OLED.

A switching gate electrode G2 of the switching TFT T2 may be connectedto the scan line 131. A switching source electrode S2 of the switchingTFT T2 is connected to the data line 151. A switching drain electrode D2of the switching TFT T2 may be connected to the driving source electrodeS1 of the driving TFT T1 and also to the driving voltage line 152 viathe operation control TFT T5. The switching TFT T2, when turned on bythe scan signal Sn transmitted through the scan line 131, may perform aswitching operation of transmitting the data signal Dm transmittedthrough the data line 151 to the driving source electrode S1 of thedriving TFT T1.

A compensation gate electrode G3 of the compensation TFT T3 may beconnected to the scan line 131. A compensation source electrode 53 ofthe compensation TFT T3 may be connected to the driving drain electrodeD1 of the driving TFT T1 and also to the pixel electrode of the organiclight emitting diode OLED via the emission control TFT TB. Acompensation drain electrode D3 of the compensation TFT 13 may beconnected to the lower electrode Cst1 of the storage capacitor Cst, afirst initialization source electrode S4 of the first initialization TFTT4, and the driving gate electrode G1 of the driving TFT T1. Thecompensation TFT T3, when turned on by, the scan signal Sn transmittedthrough the scan line 131, may electrically connect the driving gateelectrode G1 to the driving drain electrode D1 of the driving TFT T1,for example, by diode-connecting the driving TFT T1.

A first initialization gate electrode G4 of the first initialization TFTT4 may be connected to the previous scan line 132. The firstinitialization drain electrode D4 of the f initialization TFT T4 isconnected to a second initialization drain electrode D7 of the secondinitialization TFT 17 and to the initialization voltage line 123. Afirst initialization source electrode S4 of the first initialization TFT14 may be connected to the lower electrode Cst1 of the storage capacitorCst, the compensation drain electrode D3 of the compensation TFT T3, andthe driving gate electrode G1 of the driving TFT T1. The firstinitialization TFT T4, when turned on by the previous scan signal Sn−1transmitted through the previous scan line 132, may perform aninitialization operation of initializing a voltage of the driving gateelectrode G1 of the driving TFT T1 by transmitting the initializationvoltage Vint to the driving gate electrode G1 of the driving TFT T1.

An operation control gate electrode G5 of the operation control TFT T5may be connected to the emission control line 121. An operation controlsource electrode S5 of the operation control TFT T5 may be connected tothe driving voltage line 152. An operation control drain electrode D5 ofthe operation control TFT T5 may be connected to the driving sourceelectrode S1 of the driving TFT T1 and the switchingdrain electrode D2of the switching TFT T2.

An emission contra gate electrode G6 of the emission control TFT T6 maybe connected to the emission control line 121. An emission controlsource electrode S6 of the emission control TFT 16 may be connected tothe driving drain electrode D1 of the driving TFT T1 and thecompensation source electrode S3 of the compensation TFT T3. An emissioncontrol drain electrode 06 of the emission control TFT T6 may beelectrically connected to a second initialization source electrode S7 ofthe second initialization TFT T7 and the pixel electrode of the organiclight emitting diode OLED. The emission control gate electrode G6 may beprovided as a part of the emission control line 121.

The operation control TFT T5 and the emission control TFT 16 may besimultaneously turned on by the emission control signal En transmittedthrough the emission control line 121 and have the driving power voltageELVDD transmitted to the organic light emitting diode OLED, therebyallowing the driving current l_(OLED) to flow in the organic lightemitting diode OLED.

A second initialization gate electrode G7 of the second initializationTFT T7 may be connected to the subsequent scan line 133. The secondinitialization source electrode S7 of the second initialization TFT T7may be connected to the emission control drain electrode D6 of theemission control TFT T6 and the pixel electrode of the organic lightemitting diode OLED. The second initialization drain electrode 07 of thesecond initialization TFT T7 may be connected to the firstinitialization drain electrode D4 of the first initialization TFT T4 andthe initialization voltage line 123 The second initialization TFT T7when turned on by the subsequent scan signal Sn+1 transmitted throughthe subsequent scan line 133, may initialize the pixel electrode of theorganic light emitting diode OLED.

Although FIG. 3 illustrates a case in which the first initialization TFTT4 and the second initialization TFT T7 are respectively connected tothe previous scan line 132 and the subsequent scan line 133 the presentinvention is not limited thereto, In another embodiment, both of thefirst initialization TFT 14 and the second initialization TFT T7 may beconnected to the previous scan line 132 and driven by the previous scansignal Sn-1. Alternatively, the locations of the source electrodes S1-S7and the drain electrodes D1-D7 of FIG. 3 may be switched with each otheraccording to the type of a transistor,for example, a p-type or an n-typetransistor.

A detailed operation of each of the pixel a PX according to an exemplaryembodiment of the present invention is described below,

During an initialization period, when the previous scan signal Sn−1 issupplied through the previous scan line 132, the first initializationTFT T4 is turned on in response to the previous scan signal Sn-1, andthe driving TFT T1 is initialized by the initialization voltage Vintsupplied through the initialization voltage line 123.

During a data programming period, when the scan signal Sn is suppliedthrough the scan line 131 the switching TFT T2 and the compensation TFT13 are turned on in response to the scan signal Sn. In this state, thedriving TFT T1 is diode-connected by the compensation TFT T3 that isturned on and biased in a forward direction.

Then, a compensation voltage (Dm+Vth, Vth is a (−) value) that isobtained by subtracting the threshold'voltage Vth of the driving TFT T1from the voltage of the data signal Dm supplied through the data line151 is applied o the driving gate electrode G1 of the driving TFT T1.

The driving power voltage ELVDD and the compensation voltage Dm+Vth areapplied to respective ends of the storage capacitor Cst, and electriccharges corresponding to the voltage difference between both ends arestored in the storage capacitor Cst,

During an emission period, the operation control TFT T5 and the emissioncontrol TFT T6 are turned on by the emission control signal En suppliedthrough the emission control line 121. The drive current l_(OLED) isgenerated and supplied to the organic light emitting diode OLEO throughthe emission control TFT T6 according to a voltage difference betweenthe voltage of the driving gate electrode G1 of the driving TFT T1 andthe driving power voltage ELVDD.

The display apparatus according to an exemplary embodiment of thepresent invention may include a shielding conductive layer 141 extendingin the second direction from an upper electrode Cst2 of the storagecapacitor Cst and connected to the driving voltage line 152. Theshielding conductive layer 141 may be provided to prevent parasiticcapacitance that may occur between a portion A where the data line 151is disposed and a portion B for connecting the driving TFT T1 to thecompensation TFT T3. For example, portion B may refer to a portion of anode connection line 135 (see FIG. 4) that is not overlapped by thestorage capacitor Cst and includes the second node contact hole CNT2(See FIG. 4). The shielding conductive layer 141 may be connected to thedriving voltage line 152 and disposed between the switching TFT 12 andthe junction between the compensation TFT 13 and the driving TFT T1 Forexample, the shielding conductive layer 141 may be disposed in betweenthe compensation drain area D3 of the compensation TFT 13 and the gateelectrode G1 of the driving TFT T1.

A display apparatus according to an exemplary embodiment of the presentinvention is described in detail with reference to layout diagrams andcross-sectional views of FIGS. 4 to 7.

FIG. 4 is a layout diagram schematically illustrating the positions of aplurality of thin film transistors and capacitors included in a pixelcircuit, according to an exemplary embodiment of the present invention.FIG. 5 is a layout diagram of a shield conducting layer and selectelements in the vicinity of a shielding conductive layer depicted inFIG. 4, FIG. 6 is a cross-sectional view taken along line I-I′ of FIG.4. FIG. 7 is a cross-sectional view taken along lines II-II′ andIII-III′ of FIG. 4, in which an organic light emitting diode OLED isdisposed.

As illustrated in FIG. 4 the display apparatus according to anembodiment of the present invention may include the scan line 131, theprevious scan line 132, the subsequent scan line 133, a horizontaldriving voltage line 134, the emission control line 121, and theinitialization voltage line 123, which extend in a first direction, andthe data line 151 and the driving voltage line 152, which extend in asecond direction crossing the first direction. For example, the firstdirection and the second direction may be axes substantiallyperpendicular to one another.

According to an exemplary embodiment of the present invention, the scanline 131, the previous scan line 132, the subsequent scan line 133, andthe horizontal driving voltage line 134 may include the same materialand may be disposed on a same layer. The scan line 131, the previousscan line 132, and the subsequent scan line 133 may be disposed on adifferent layer from a layer where the gate electrodes G1-G7 of the TFTsT1-T7 are disposed and may each have a resistance less than theresistance of each of the gate electrodes G1-G7. In other words, thespecific resistance value of the scan line 131 may be less than thespecific resistance value of each of the gate electrodes G1-G7.Accordingly, an RC delay effect due to application of a scan signal maybe prevented or reduced.

For example, the scan line 131, the previous scan line 132, and thesubsequent scan line 133 may be disposed on an interlayer insulatinglayer 114 (See FIGS. 6 and 7) and may include a conductive materialincluding aluminum (Al), copper (Cu), titanium (Ti) and/or molybdenum(Mo) in the form of a multilayer or a single layer including the abovematerial. For example, the scan line 131, the previous scan line 132,and the subsequent scan line 133 may have a multilayer structure ofTi/Al/Ti.

The gate electrodes G1-G7 may be disposed on a first gate insulatinglayer 112 (See FIGS. 6 and 7) and may include Mo and/or Ti in the formof a single layer or a multilayer. For example, the gate electrode G1may include a single Mo layer.

A second gate insulating layer 113 and the interlayer insulating layer114 (See FIGS. 6 and 7) may be disposed between the scan line 131 andthe gate electrodes G1-G7. In other words, the scan line 131, theprevious scan line 132, and the subsequent scan line 133 are disposed ona different layer from the layer where the gate electrodes G1-G7connected thereto are disposed. The scan line 131, the previous scanline 132, and the subsequent scan line 133 may be connected to the gateelectrodes G1-G7 via contact holes

The emission control line 121 may include the same material as that ofthe gate electrodes G1-G7 and may be disposed on the same layer as thefirst gate insulating layer 112.

The data line 151 and the driving voltage line 152 and at least aportion of the scan line 131 may have a via layer 115 disposedtherebetween. The data line 151 and the driving voltage line 152 mayhave a specific resistance value similar to that of the scan line 131.For example, the data line 151 and the driving voltage line 152 mayinclude a conductive material including Al, Cu, Ti and/or Mo in the formof a multilayer or a single layer including the above material. Forexample, the data line 151 and the driving voltage line 152 may have amultilayer structure of Ti/Al/Ti.

The horizontal driving voltage line 134 extending in the first directionmay be disposed on another layer and may be connected to the drivingvoltage line 152 extending in the second direction via a contact hole.Accordingly, the horizontal driving voltage line 134 and the drivingvoltage line 152 may have a mesh structure.

Furthermore, the display apparatus according to an exemplary embodimentof the present invention may include the driving TFT T1, the switchingTFT T2, the compensation TFT T3, the first initialization TFT T4, theoperation control TFT T5, the emission control TFT 16, the secondinitialization TFT 17 and the storage capacitor Cst.

A driving semiconductor layer A1 of the driving TFT T1, a switchingsemiconductor layer A2 of the switching TFT T2, a compensationsemiconductor layer A3 of the compensation TFT T3, a firstinitialization semiconductor layer A4 of the first initialization TFTT4, an operation control semiconductor layer A5 of the operation controlTFT T5, an emission control semiconductor layer AG of the emissioncontrol TFT T6, and a second initialization semiconductor layer A7 ofthe second initialization TFT T7 may be disposed on the same layer andmay include a same material. For example, the semiconductor layers A1-A7may include polycrystal silicon and/or amorphous silicon. Alternatively,the semiconductor layers A1-A7 may include>an oxide semiconductormaterial including an oxide of material selected from at least one ofindium (in), gallium (Ge), stannum (Sn), zirconium (Zr), vanadium (V),hafnium(Hf), cadmium (Cd), germanium (Ge), chromium (Cr), titanium (Ti),aluminum (Al), cesium (Cs), cerium (Ce), and zinc (Zn). Thesemiconductor layers A1-A7 may be connected to each other and may bebent in various shapes.

Each of the semiconductor layers A1-A7 may include a channel area, and asource area and a drain area disposed at both sides of the channel area.According to an exemplary embodiment of the present invention, thesource area and the drain area may be doped with impurities, and theimpurities may include N-type impurities or P-type impurities. Thesource area and the drain area correspond to a source electrode and adrain electrode, respectively. In the following description, terms suchas a source area and a drain area may be used instead of the sourceelectrode and the drain electrode.

The driving TFT T1 may include the driving semiconductor layer A1, thedriving gate electrode G1, the driving source area S1, and the drivingdrain area D1. The driving semiconductor layer A1 may be bent. Thestorage capacitor Cst may be provided to at least partially overlap thedriving TFT T1 therebelow.

The driving semiconductor layer A1 may include the driving channel area,and the driving source area S1 and the driving drain area D1 disposed atrespective sides of the driving channel area. The driving semiconductorlayer A1 may have a bent shape so as to be longer than othersemiconductor layers A2 to A7. For example, because the drivingsemiconductor layer A1 may feature multiple interconnected bent segmentsand have an overall shape like the omega symbol or the letter “S”, along channel length may be obtained within a narrow space. As thedriving semiconductor layer A1 is formed with a long channel length, adriving range of a gate voltage applied to the driving gate electrode G1extends, and thus gradation of light emitted from the organic lightemitting diode OLED may be accurately controlled, thereby increasingdisplay quality.

The storage capacitor Cst may include the lower electrode Cst1 and theupper electrode Cst2 which are interposed with the second gateinsulating layer 113 disposed therebetween. The driving gate electrodeG1 simultaneously works as the lower electrode Cst1. In other words, thedriving gate electrode GI may be formed integrally with the lowerelectrode Cst1. The second gate insulating layer 113 works as adielectric of the storage capacitor Cst, and storage capacitance isdetermined by the electric charges stored in the storage capacitor Cstand the voltage between both the lower electrode Cst1 and the upperelectrode Cst2,

The lower electrode Cst1 may be formed, as a floating electrode havingan island shape, on the same layer and of a same material as that of theemission control line 121, the switching gate electrode G2, thecompensation gate electrode G3, the first initialization gate electrodeG4, the operation control gate electrode G5, the emission control gateelectrode G6, and the second initialization gate electrode G7.

The upper electrode Cst2 may be disposed on the second gate insulatinglayer 113. The upper electrode Cst2 may be provided at least partiallyoverlapping the lower electrode Cst1 and may have a storage opening Sop.The storage opening Sop is provided overlapping the lower electrodeCst1. The storage opening Sop may have a shape of a single closed curvepenetrating, the upper electrode Cst2. The single closed curve maydenote a close line figure such as a polygon or a circle, in which astart point and an end point are identical when a point is marked on astraight line or a curved line. The upper electrode Cst2 may also atleast partially overlap the horizontal driving voltage line 134, thedriving TFT T1, the emission control TFT T6, the data line 151, and thedriving voltage line 152 in a plan view. The upper electrode Cst2 isconnected to the driving voltage line 152 via a contact hole andreceives the driving power voltage EL DD.

The switching TFT 12 may include the switching semiconductor layer A2and the switching gate electrode G2. The switching semiconductor layerA2 may include the switching source area S2 and the switching drain areaD2 disposed at respective sides of a switching channel area. Theswitching drain area D2 may be connected to the driving source area S1.

The compensation TFT T3 may include the compensation semiconductor layerA3 and the compensation gate electrode G3. The compensationsemiconductor layer A3 may include the compensation source area S3 andthe compensation drain area D3 disposed at respective sides of acompensation channel area. The compensation TFT T3 formed in thecompensation semiconductor layer A3 may include two compensation channelareas as a dual thin film transistor. The area between the compensationchannel areas may be an area doped with impurities that locallycorresponds to a source area of any one of the dual thin film transistorand also to a drain area of the other. The compensation drain area D3may be connected to the lower electrode Cst1 through a node connectionline 135. The compensation gate electrode G3 may prevent leakage ofcurrent by forming a separate dual gate electrode.

The first initialization TFT T4 may include the first initializationsemiconductor layer A4 and the first initialization gate electrode G4.The first initialization semiconductor layer A4 may include the firstinitialization source area S4 and the first initialization drain area D4disposed at respective sides of a first initialization channel area. Thefirst initialization TFT T4 formed in the first initializationsemiconductor layer A4 may include two first initialization channelareas. For example, the two first initialization channel areas may beprovided as a dual thin film transistor. The area between the firstinitialization channel areas may be an area doped with impurities andlocally corresponds to a source area of any one of the dual thin filmtransistor and also to a drain area of the other. The firstinitialization source area S4 may be connected to the lower electrodeCst1 through the node connection line 135. The first initializationdrain area D4 may be connected to the initialization voltage line 123.

The operation control TFT 15 may include the operation controlsemiconductor layer A5 and the operation control gate electrode G5. Theoperation control semiconductor layer A5 may include the operationcontrol source area S5 and the operation control drain area 05 disposedat respective sides of an operation control channel area. The operationcontrol drain area D5 may be connected to the driving source area S1.

The emission control TFT 16 may include the emission controlsemiconductor layer A6 and the emission control gate electrode G6. Theemission control semiconductor layer A6 may include the emission controlsource area S6 and the emission control drain area D6 disposed atrespective sides of an emission control channel area. The emissioncontrol source area S6 may be connected to the driving drain area D1.

The second initialization TFT T7 may include the second initializationsemiconductor layer A7 and the second initialization gate electrode G7.The second initialization semiconductor layer A7 may include the secondinitialization source area S7 and the second initialization drain areaD7 disposed at respective sides of the second initialization channelarea.

The initialization voltage Fine 123 may be disposed on a same layer asthe semiconductor layers A1-A7 and may include a same material as thesemiconductor layers A1-A7. The initialization voltage line 123 may beconnected to the first initialization drain area D4 of the firstinitialization TFT T4 and the second initialization drain area D7 of thesecond initialization TFT T7.

One end of the driving semiconductor layer A1 of the driving TFT T1 maybe connected to the Aching semiconductor layer A2 and the operationcontrol semiconductor layer A5, and the other end of the drivingsemiconductor layer A1 may be connected to the compensationsemiconductor layer A3 and the emission control semiconductor layer A6.Accordingly, the driving source electrode S1 may be connected to theswitching drain electrode D2 and the operation control drain electrodeD5, and the driving drain electrode D1 is connected to the compensationsource electrode S3 and the emission control source electrode S6.

The lower electrode Cst1 of the storage capacitor Cst is connected tothe compensation TFT T3 and the initialization TFT T4 through the nodeconnection line 135. The node connection line 135 may be disposed on thesame layer as a layer where the scan line 131 is disposed. One end ofthe node connection line 135 may be connected to the lower electrodeCst1 via a first node contact hole CNT1 formed in the second gateinsulating layer 113 and the interlayer insulating layer 114. The firstnode contact hole CNT1 may be disposed inside the storage opening Sop ofthe upper electrode Cst2. The size of the storage opening Sop may begreater than that of the first node contact hole CNT1 and thus the firstnode contact hole CNT1 may be connected to the lower electrode Cst1without contacting the upper electrode Cst2.

The other end of the node connection line 135 may be connected to thecompensation drain area D3 and the first initialization drain area 04via a second node contact hole CNT2 formed in the first gate insulatinglayer 112, the second gate insulating layer 113, and the interlayerinsulating layer 114.

The upper electrode Cst2 of the storage capacitor Cst may be connectedto the driving voltage line 152 via a contact hole disposed in theinterlayer insulating layer 114 and via layer 115, and may receive thedriving power voltage ELVR though the driving voltage line 152.

The switching TFT T2 is used as a switching device to select a pixel toemit light. The switching gate electrode G2 may be connected to the scanline 131 disposed on a different layer via a′contact hole. The switchingsource area S2 may be connected to the data line 151 via a contact hole.The switching drain area D2 is connected to the driving TFT T1 and theoperation control TFT T5.

The emission control drain electrode D6 of the emission control TFT T6may be directly connected to the pixel electrode of the organic lightemitting diode OLED via a via hole formed in the via layer 115 and aplanarization layer 116

The display apparatus according to an exemplary embodiment of thepresent invention may include the shielding conductive layer 141. Theshielding conductive layer 141 reduces parasitic capacitance between aportion A where the data line 151 is disposed and a portion B forconnecting the driving TFT T1 to the compensation TFT T3.

The shielding conductive layer 141 may extend from the upper electrodeCst2 of the storage capacitor Cst. In other words, the shieldingconductive layer 141 may be formed integrally with the upper electrodeCst2 or contiguous therewith. For example, the shielding conductivelayer 141 may protrude from one side of the upper electrode Cst2 in thesecond direction. The shielding conductive layer 141 may be connected tothe driving voltage line 152 via a contact hole and may receive thedriving power voltage ELVDD that is a DC voltage.

FIG. 5 shows a configuration of the shielding conductive layer 141 andselect adjacent elements and FIG. 6 illustrates a cross-sectional viewtaken along line I-I′ of

FIG. 4 including the shielding conductive layer 141. Referring to FIG. 5in a plan view, the shielding conductive layer 141 may be disposedbetween the data line 151 and the node connection line 135, and/orbetween the data line 151 and a semiconductor connection line 125. Thesemiconductor connection line 125 may be a wiring connected to thecompensation TFT T3 and may be a part of the compensation drain area D3.

When the shielding conductive layer 141 is not provided, parasiticcapacitance occurs between the data line 151 and the node connectionline 135, or between the data line 151 and the semiconductor connectionline 125, and thus the characteristics of the driving TFT T1 may bechanged based on the supply of a signal through the data line 151

However, the display apparatus according to an exemplary embodiment ofthe present invention may include the shielding conductive layer 141which may prevent the occurrence of parasitic capacitance. Furthermore,the shielding conductive layer 141 that receives the driving powervoltage ELVDD that is a DC voltage to maintain a constant voltage mayreduce the coupling effect by the signal of the data line 151.

The node connection line 135 and the semiconductor connection line 125may be wirings for connecting the compensation TFT T3 to the driving TFTT1 The node connection line 135 may be disposed on the interlayerinsulating layer 114 that is the same layer as a layer where the scanline 131 is disposed. The semiconductor connection line 125 may bedisposed on a buffer layer 111 that is a same layer as the layer wherethe semiconductor layers A1-A7 are disposed. In other words,the dataline 151 may be disposed farther from the semiconductor connection line125 than the node connection line 135. The length of the node connectionline 135 may be decreased order to reduce the parasitic capacitance. Thenode connection line 135 may be connected to the driving gate electrodeG1 at a first end and connected to the semiconductor connection line 125at a second end. The first end may be completely overlapped by the upperelectrode Cst2 in a plan view, and a long side of the second enddisposed adjacent to the data line 151 may be at least partiallysurrounded by a side of the shielding conductive layer 141 extending inthe second direction. For example, the portion of the node connectionline 135 that is not covered by the upper electrode Cst2 (e.g. thesecond end) may have a shorter length of extension in the seconddirection than a length of extension of the shielding conductive layer141 at least partially surrounding it.

Accordingly, in an exemplary embodiment of the present invention, thesemiconductor connection line 125 may include a first portion thatextends in the second direction that is the same direction as adirection in which the shielding conductive layer 141 extends and asecond portion that extends substantially in the first direction. A sideof the first portion adjacent to the data line 151 may be completelyoverlapped by a shielding conductive layer 141. The shielding conductivelayer 141 may be disposed between a via of the data line 151 and thesecond node contact hole CNT2 and at least partially surround both.

The configuration included in the display apparatus according to anexemplary embodiment of the present invention is described withreference to FIG. 7. FIG. 7 is a cross-sectional view taken along linesII-II′ and III-III′ FIG. 4, in which an organic light-emitting diodeOLED is disposed.

A substrate 110 may include a glass member, a ceramic member, a metalmember, and/or a flexible or bendable material. When the substrate 110is flexible or bendable, the substrate 110 may include polymer resinsuch as polyethersulfone (PES), polyacrylate (PA), polyether imide(PEI), polyethylene naphthalate (PEN), polyethylene terephthalate(PET),polyphenylene sulfide (PPS), polyarylate (PAR), polyimide (Pl),polycarbonate (PC), and/or cellulose acetate propionate (CAP). Thesubstrate 110 may have a single, layer or multilayer structure includingat least one of the above materials. For a multilayer structure, thesubstrate 110 may further include an inorganic layer. According to anexemplary embodiment of the present invention, the substrate 110 mayhave a structure of an organic material/an inorganic material/an organicmaterial.

The buffer layer 111 may be disposed on the substrate 110 and mayprevent or reduce intrusion of foreign materials, moisture or externalair into a lower portion of the substrate 110 and provides aplanarization surface on the substrate 110. The buffer layer 111 mayinclude an inorganic material such as oxide or nitride, an organicmaterial, and/or an organic/inorganic complex in a single layer ormultilayer structure of an inorganic material and an organic material.

A barrier layer may further be provided between the substrate 110 andthe buffer layer 111. The barrier layer may prevent or reduce intrusionof impurities from the substrate 110 into the semiconductor layers A1-A7. The barrier layer may include an inorganic material such as oxideor nitride, an organic material, and/or an organic/inorganic complex ina single layer or multilayer structure of an inorganic material and anorganic material.

The semiconductor layers A1, A3, and A6 may be disposed on the bufferlayer 111. The semiconductor layers A1, A3, and A6 may include amorphoussilicon and/or polysilicon. According to an exemplary embodiment of thepresent invention, the semiconductor layer A1 may include an oxide of atleast one material selected from the group consisting of In, Ga, Sn, Zr,V, Hf, Cd, Ge, Cr, Ti, Al, Cs, Ce, and Zn. According to an exemplaryembodiment of the present invention, the semiconductor layers A1 A3, andA6 may include a Zn oxide-based material such as Zn oxide (ZnO),In—Zn-oxide (IZO), and/or Ga—ln—Zn oxide. According to an exemplaryembodiment of the present invention, the semiconductor layer A1 mayinclude In—Ga—Zn—O (IGZO), In—Sn—Zn—O (ITZO), and/or In—Ga—Sn—Zn—O(IGTZO) semiconductor in which metal such as In, Ga, or Sn is containedin ZnO, The semiconductor layers A1, A3, and AB may include the channelarea, the source area and the drain area disposed at respective sides ofthe channel area. The semiconductor layers A1, A3, and A6 may each be asingle layer or a multilayer.

The gate electrodes G1 G3, and G6 are disposed on the semiconductorlayers A1, A3, and A6 at least partially overlapping the semiconductorlayers A1, A3, and A6 with the first gate insulating layer 112therebetween. The gate electrodes G1 G3, and G6 may include Mo, Al, Cuor Ti in the form of a single layer or a multilayer. According to anexemplary embodiment of the present invention, the gate electrodes G1G3, and G6 may be a single Mo layer.

The first gate insulating layer 112 may include silicon oxide (SiO₂)),silicon nitride (Si₃N₄), silicon oxynitride (SiO_(x)N_(y)), aluminumoxide (Al₂O₃), titanium oxide (TiO₂), tantalum oxide (Ta₂O₅), hafniumoxide (HfO₂), or ZnO.

The second gate insulating layer 113 may be provided to cover the gateelectrodes G1, G3, and G6. The second gate insulating layer 113 mayinclude SiO₂, Si₃N₄, SiO_(x)N_(y), Al₂O₃, TiO₂, Ta₂O₅, HfO₂, or ZnO.

The lower electrode Cst1 of the storage capacitor Cst may overlap thedriving TFT T1. For example, the driving gate electrode G1 of thedriving TFT T1 may also perform a function as the lower electrode Cst1of the storage capacitor Cst.

The upper electrode Cst2 of the storage capacitor Cst may overlap thelower electrode Cst1 with the second gate insulating layer 113 disposedtherebetween. In this case, the second gate insulating layer 113 mayfunction as a dielectric layer of the storage capacitor Cst. The upperelectrode Cst2 may include a conductive material including Mo, Al, Cu,or Ti in the form of a multilayer or a single layer including the abovematerial.

The interlayer insulating layer 114 may be provided to cover the upperelectrode Cst2 of the storage capacitor Cst. The interlayer insulatinglayer 114 may include SiO₂, Si₃N₄, SiO_(x)N_(y), Al₂O₃, TiO₂, Ta₂O₅,HfO₂, or ZnO.

The scan line 131 and the node connection line 135 may be disposed onthe interlayer insulating layer 114. The scan line 131 and the nodeconnection line 135 may include a conductive material including at leastone of Al Cu and Ti in the form of a multilayer or a single layer.According to an exemplary embodiment of the present invention, thedriving source electrode S1 and the driving drain electrode D1 may havea multilayer structure of Ti/Al/Ti.

One end of the node connection line 135 may be connected to the drivinggate electrode G1 via the first node contact hole CNT1 penetrating theinterlayer insulating layer 114 and the second gate insulating layer113. The other end of the node connection line 135 may be connected tothe semiconductor connection line 125 via the second node contact holeCNT2 penetrating the interlayer insulating layer 114, the second gateinsulating layer 113, and the first gate insulating layer 112. Thesemiconductor connection line 125 may be wiring extending from thecompensation drain area D3 of the compensation TFT T3.

The scan line 131 may be connected to the compensation gate electrode G3via a contact hole penetrating the interlayer insulating layer 114 andthe second gate insulating layer 113. A connection electrode 136 may beconnected to the emission control drain area D6 of the emission controlTFT T6 via a contact hole penetrating the interlayer insulating layer114 the second gate insulating layer 113, and the first gate insulatinglayer 112.

The via layer 115 may be disposed on the scan line 131 the nodeconnection line 135 and the connection electrode 136. The data line 151and the driving voltage line 152 may be disposed on the via layer 115.

The via layer 115 may include a general polymer for general use such asbenzocyclobutene (BCB), Pl, hexamethyldisiloxane (HMDSO), polymethylmthacrylate (PMMA). or polystylene (PS), a polymer derivative having aphenol group, an acrylic polymer, an imide polymer, an aryl etherpolymer, an amide polymer, a fluorine polymer, a p-xylene polymer, avinyl alcohol polymer, and/or a blend thereof. The via layer 115 mayinclude an inorganic material. The via layer 115 may include SiO₂,Si₃N₄, SiO_(x)N_(y), Al₂O₃, TiO₂, Ta₂O₅, HfO₂, or ZnO. When the vialayer 115 includes an inorganic material, chemical planarizationpolishing may be performed as necessary. The via layer 115 may includeboth an organic material and an inorganic material.

The planarization layer 116 may be disposed on the data line 151 and thedriving voltage line 152. The planarization layer 116 may include anorganic material such as an acryl based compound, BCB, Pl, and/or HMDSO.Alternatively, the planarization layer 116 may include an inorganicmaterial. The planarization layer 116 may substantially planarize anupper surface of a protection film covering the TFTs T1-T7. Theplanarization layer 11 may be provided in the form of a single layer ora multilayer.

An organic light emitting diode OLED has a pixel electrode 210, acounter electrode 230 and an intermediate layer 220 disposedtherebetween. An emission layer may be disposed on the planarizationlayer 116.

The pixel electrode 210 may be connected to the connection electrode 136via a via hole penetrating the planarization layer 116 and the via layer115 and to the emission control drain area D6 of the emission controlTFT T6 by the connection electrode 136.

A pixel defining layer 117 may be disposed on the planarization layer116. The pixel defining layer 117 may have an opening corresponding toeach sub-pixel. In other words, an opening may expose at least a centralportion of the pixel electrode 210, thereby defining a pixel.Furthermore, the pixel defining layer 117 increases a distance betweenan edge of the pixel electrode 210 and the counter electrode 230 abovethe pixel electrode 210 to prevent generation of an arc at the edge ofthe pixel electrode 210. The pixel defining layer 117 may include anorganic material such as PI or HMDSO.

The intermediate layer 220 of the organic light emitting diode OLED mayinclude a low molecular weight polymer material. When the intermediatelayer 220 includes a low molecular weight material, the intermediatelayer 220 may have a structure in which a hole injection layer (HIL), ahole transport layer (HTL), an emission layer (EML), an electrontransport layer (ETL), and an electron injection layer (EIL) are stackedin a single or composite structure. The intermediate layer 220 mayinclude various organic materials such as copper phthalocyanine (CuPc),N,N′-Di(naphthalene-1-yl)-N,N′-diphenyl-benzidine (NPB), and/ortris-8-hydroxyquinoline aluminum (Alq₃). These layers may be formed by avacuum deposition method.

When the intermediate layer 220 includes a polymer material, theintermediate layer 220 may generally have a structure including an HTLand an EML. In this case, the HTL may include poly(3,4-ethylenedioxythiophene) polystyrene sulfonate (PEDOT), and the EMLmay include a polymer material such as poly p-phenylene vinylene (PPV)or polyfluorene (PFO). The intermediate layer 220 may be formed by ascreen print method, an inkjet print method, or a laser induced thermalimaging (LITI) method.

However, the intermediate layer 220 is not necessarily limited thereto,and may have various structures. The intermediate layer 220 may includea layer that is integral across a plurality of the pixel electrodes 210or may include a layer patterned to correspond to each of the pixelelectrodes 210.

The counter electrode 230 may be disposed above the display area DA andmay be disposed to cover the display area DA. In other words, thecounter electrode 230 may be formed integrally in a plurality of organiclight-emitting devices (for example, organic light emitting diode OLED)and may correspond to the pixel electrodes 210.

As the organic light emitting diode OLED is easily damaged by externalmoisture or oxygen, a thin film encapsulation layer 300 may protect theorganic light emitting diode OLED by covering the same. The thin filmencapsulation layer 300 may cover the display area DA and extend to theoutside of the display area DA. The thin film encapsulation layer 300may include a first inorganic encapsulation layer 310, an organicencapsulation layer 320, and a second inorganic encapsulation layer 330.

The first inorganic encapsulation layer 310 covers the counter electrode230 and may include ceramic, metal oxide, metal nitride, metal carbide,metal oxynitride, indium oxide (In₂O₃), tin oxide (SnO₂), indium tinoxide (ITO), SiO₂, Si₃N₄ and/or SiO_(x)N_(y). As necessary, other layerssuch as a capping layer may be disposed between the first inorganicencapsulation layer 310 and the counter electrode 230. As the firstinorganic encapsulation layer 310 is formed corresponding to anunderstructure thereof, an upper surface of the first inorganicencapsulation layer 310 may not be flat.

The organic encapsulation layer 320 may cover the first inorganicencapsulation layer 310, and an upper surface of the organicencapsulation layer 320 may be substantially flat unlike the firstinorganic encapsulation layer 310, in detail, the upper surface f theorganic encapsulation layer 320 may be substantially flat at a portioncorresponding to the display area DA. The organic encapsulation layer320 may include at least one material selected from the group consistingof acrylic, methacryl, polyester, polyethylene, polypropylene, PET, PEN,PC, PI, PEDOT, polyoxymethylene, PAR, and HMDSO.

The second inorganic encapsulation layer 30 may, cover the organicencapsulation layer 320, and may include ceramic, metal oxide, metalnitride, metal carbide, metal oxynitride, In₂O₃, SnO₂, ITO, SiO₂, Si₃N₄,and/or SiO_(x)N_(y).

As such, the thin film encapsulation layer 300 may include the firstinorganic encapsulation layer 310, the organic encapsulation layer 320,and the second inorganic encapsulation layer 330. Due to the abovemultilayer structure, even when cracks occur in the thin filmencapsulation layer 300, such cracks may not be connected between thefirst inorganic encapsulation layer 310 and the organic encapsulationlayer 320 or between the organic encapsulation layer 320 and the secondinorganic encapsulation layer 330. Accordingly, the formation of a pathalong which the external moisture or oxygen intrudes into the displayarea DA may be prevented or reduced.

A spacer for preventing mask scratches may be further provided on thepixel defining layer 117. Various functional layers such as apolarization layer, a black matrix, a color filter, and/or a touchscreen layer with a touch electrode, to reduce external lightreflection, may be provided on the thin film encapsulation layer 300.

As described above, according to the above embodiments of the presentinventive concept, as the shielding conductive layer extending from oneelectrode of the storage capacitor is disposed between the nodeconnection line connecting the driving TFT and the data line, crosstalkdue to parasitic capacitance may be reduced

Furthermore, as the scan line having resistance lower than that of thegate electrode of the switching TFT is used, an RC delay effect may beprevented.

While the present invention has been particularly shown and described inreference to exemplary embodiments thereof, it will be understood bythose of ordinary skill in the art that various changes in form anddetail may be made therein without departing, from the scope of thepresent invention as defined by the claims.

What is claimed is:
 1. A display apparatus comprising: a substrate; adriving thin film transistor disposed on the substrate, wherein thedriving thin film transistor includes a driving semiconductor layer anda driving gate electrode; a scan line overlapping the substrate andextending in a first direction; a data line extending in a seconddirection crossing the first direction, wherein the data line isinsulated from the scan line by an insulating layer a node connectionline disposed on a same layer as the scan line; and a shieldingconductive layer disposed between the data line and the node connectionline, wherein a first end of the node connection line is connected tothe driving gate electrode via a first node contact hole.
 2. The displayapparatus of claim 1, further comprising a storage capacitor overlappingthe driving thin film transistor and having a lower electrode and anupper electrode, wherein the shielding conductive layer extends from aside of the upper electrode.
 3. The display apparatus of claim 2,wherein the lower electrode of the storage capacitor is intergrallyprovided with the driving gate electrode of the driving thin filmtransistor.
 4. The display apparatus of claim 1, further comprising adriving voltage line extending in the second direction and, disposed ona same layer as the data line, wherein the shielding conductive layer isconnected to the driving voltage line.
 5. The display apparatus of claim1, further comprising: a compensation thin film transistor connected tothe scan line and including a compensation semiconductor layer and acompensation gate electrode; and a semiconductor connection lineextending from the compensation semiconductor layer, wherein a secondend of the node connection line is connected to the semiconductorconnection line via a second node contact hole.
 6. The display apparatusof claim 5, wherein each of the shielding conductive layer and thesemiconductor connection line includes a portion extending in the seconddirection.
 7. The display apparatus of claim 1, wherein a resistancevalue of the scan line is less than a resistance value of the drivinggate electrode.
 8. The display apparatus of claim 1, further comprisinga storage capacitor in which the driving gate electrode functions as alower electrode of the storage capacitor, and having an upper electrodeoverlapping the lower electrode and having a storage opening, whereinthe first node contact hole is disposed in the storage opening.
 9. Thedisplay apparatus of claim 8, wherein a size of the storage opening isgreater than a size of the first node contact hole.
 10. The displayapparatus of claim 1, further comprising: an emission control thin filmtransistor disposed on the substrate and including an emission controlsemiconductor layer and an emission control gate electrode; and emissioncontrol lines through which an emission control signal is transmitted tothe emission control gate electrode, wherein the emission control gateelectrode is a part of the emission control lines.
 11. A displayapparatus comprising: a substrate; a driving thin film transistordisposed on the substrate and having a d gate electrode and a drivingsemiconductor layer; a first gate insulating layer disposed between thedriving gate electrode and the driving semiconductor layer; a secondgate insulating layer covering the driving gate electrode; a shieldingconductive layer disposed on the second gate insulating layer; aninterlayer insulating layer covering the shielding conductive layer; anode connection line disposed on the interlayer insulating layer andconnected to the driving gate electrode via a first node contact holepenetrating the interlayer insulating layer and the second gateinsulating layer; a scan line disposed on a same layer as the nodeconnection line, wherein the scan line extends in a first direction; avia layer covering the scan line and the node connection line; and adata line disposed on the via layer and extending in a second directioncrossing the first direction, wherein the shielding conductive layerextends in the second direction between the data line and the nodeconnection line.
 12. The display apparatus of claim 11, wherein aresistance value of the scan line is less than a resistance value of thedriving gate electrode.
 13. The display apparatus of claim 11, furthercomprising a storage capacitor overlapping the driving thin filmtransistor and having a lower electrode and an upper electrode, whereinthe shielding conductive layer extends from the upper electrode in thesecond direction.
 14. The display apparatus of claim 13, wherein thelower electrode of the storage capacitor is integrally formed with thedriving gate electrode of the driving thin film transistor.
 15. Thedisplay apparatus of claim 13, wherein the upper electrode has a storageopening, the storage opening has a closed curve shape, and the firstnode contact hole is disposed in the storage opening.
 16. The displayapparatus of claim 11, wherein the driving semiconductor layer is bent.17. The display apparatus of claim 11, further comprising, a drivingvoltage line extending in the second direction and disposed on a samelayer as the data line, wherein the shielding conductive layer receivesa direct current (DC) voltage through the driving voltage line.
 18. Thedisplay apparatus of claim 11, further comprising: a compensation thinfilm transistor connected to the scan line and including a compensationsemiconductor layer and a compensation gate electrode; and asemiconductor connection line extending from the compensationsemiconductor layer, wherein an end of the node connection line isconnected to the semiconductor connection line via a second node contacthole.
 19. The display apparatus of claim 18, wherein each of theshielding conductive layer and the semiconductor connection lineincludes a portion extending in the second direction.
 20. The displayapparatus of claim 11, further comprising: an emission control thin filmtransistor disposed on the substrate and including an emission controlsemiconductor layer and an emission control gate electrode; and anorganic light-emitting diode connected to the emission control thin filmtransistor.
 21. The display apparatus of claim 19, wherein the portionof the shielding conductive layer extending in the second direction islonger than the portion of the semiconductor connection line extendingin the second direction.
 22. The display apparatus of claim 19, whereinthe node connection line includes a portion extending in the seconddirection and the portion of the shielding conductive layer extending inthe second direction is longer than the portion of the node connectionline extending in the second direction.
 23. The display apparatus ofclaim 21, wherein the shielding conductive layer is disposed between avia of the data line and the second node contact hole and at leastpartially surrounds both.